An electronic scale is disclosed which has multiple overload protection features for protecting the load cell and a weight distribution plate from excessive strain due to vertical overload on the scale or from twisting resulting from an article being placed thereon which exceeds the load capacity of the scale or from excessive forces due to mishandling of the scale. A first overload protection is in the form of a boss molded into the base of the scale on which the free end of the load cell abuts if an excessive load is placed on the platter of the scale. A second overload protection is in the form of a peripheral depending flange on the platter which abuts a peripheral portion of the a top cover to prevent excessive strain on the load cell and a weight distribution plate from excessive loading or mishandling of the scale. A third overload protection is in a plurality of ribs which are molded into the base and which extend upwardly adjacent the under surface of the four corners of the weight distribution plate so that the weight distribution plate abuts these ribs in the event that an excessive load is placed on the platter in an off center manner. The weight distribution plate is also provided with means for causing the weight of an article placed on the platter in an off center manner to be transferred to the point where the weight distribution plate is attached to the free end of the load cell so that an accurate weight is measured by the scale regardless of the placement of an article on the platter.
Multiple overload protection for electronic scales
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